Number of the records: 1
The High-Frequency Characterization Of InAlGaN/GaN HEMT utilizing RF Measurements
- FLOROVIČ, Martin et al. The High-Frequency Characterization Of InAlGaN/GaN HEMT utilizing RF Measurements. In ADEPT 2024 : 12th International conference on advances in electronic and photonic technologies. Nový Smokovec, Slovakia. June 24-27, 2024. 1. vyd. Žilina : Vydavateľstvo EDIS, 2024, S. 49-52. ISBN 978-80-554-2109-4. E*e-215/2024
Number of the records: 1