- The High-Frequency Characterization Of InAlGaN/GaN HEMT utilizing RF …
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The High-Frequency Characterization Of InAlGaN/GaN HEMT utilizing RF Measurements

  1. FLOROVIČ, Martin et al. The High-Frequency Characterization Of InAlGaN/GaN HEMT utilizing RF Measurements. In ADEPT 2024 : 12th International conference on advances in electronic and photonic technologies. Nový Smokovec, Slovakia. June 24-27, 2024. 1. vyd. Žilina : Vydavateľstvo EDIS, 2024, S. 49-52. ISBN 978-80-554-2109-4. E*e-215/2024
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