SiC. HWCVD. structural and electrical characterization. solar structureHuran, Jozef HWCVD technology of silicon carbide thin films: Properties / aut. Jozef Huran, Miroslav Mikolášek, Pavol Boháček, Angela Kleinová, Vlasta Sasinková, Alexander P Kobzev, Mária Sekáčová, J Arbet. Mikolášek, Miroslav, 1983-. Boháček, Pavol. Kleinová, Angela. Sasinková, Vlasta. Kobzev, Alexander P.. Sekáčová, Mária. Arbet, J In: ADEPT 2015. -- 1. vyd.. -- 334 s.. -- 978-80-554-1033-3 3rd international conference on advances in electronic and photonic technologies. -- Žilina : University of Žilina, 2015. -- S. 104-107.